半導体CV特性測定器 TECHMIZE 型式：TH511【国内正規品】

販売価格(税抜):¥2,880,000

■製品仕様：
Ciss、 Coss、 Crss、 Rg、スポット・テスト、
リスト・スキャン、テスト周波数: 1kHz-2MHz、
VGS: ±40V、 VDS: ±200V、 2チャンネル

製品詳細

■アプリケーション

• 半導体コンポーネント/電力コンポーネント

ダイオード、トライオード、MOSFET、IGBT、サイリスタ、統合回路、光電子チップなどの寄生容量テストおよびC-V特性分析

• 半導体材料

ウェハー、C-V特性分析

• 液晶材料

弾性定数分析

• 電気容量要素

コンデンサC-V特性テストおよび分析、電気容量センサーテストおよび分析

Specifications

Model			TH511	TH512		TH513
Channel			2 (4/6 Ch Optional)			2
Display	Display		10.1-inch capacitive touchscreen
	Ratio		0.672916667
	Resolution		1280RGB800
Test Parameter			Ciss, Coss, Crss, Rg. Four parameter selectable arbitrarily
Test Frequency	Range		1kHz-2MHz
	Accuracy		0.0001
	Resolution		10mHz 1.00000kHz-9.99999kHz
			100mHz 10.0000kHz-99.9999kHz
			1Hz 100.000kHz-999.999kHz
			10Hz 1.00000MHz-2.00000MHz
Test Level	Voltage Range		5mVrms-2Vrms
	Accuracy		± (10%*Setting Value+2mV)
	Resolution		1mVrms 5mVrms-1Vrms
			10mVrms 1Vrms-2Vrms
Vgs	Range		0 – ±40V
	Accuracy		1%* Setting Voltage+8mV
	Resolution		1mV 0V – ±10V
			10mV ±10V – ±40V
Vds	Range		0 – 200V		0 – 1500V	0 – 3000V
	Accuracy		1%* Setting Voltage+100mV
Output Impedance			100Ω, ±2%@1kHz
Computation			Absolute deviation Δ from nominal value, percent deviation from nominal value Δ%
Calibration Function			OPEN, SHORT, LOAD
Measure Average			1-255 times
AD Conversion Time (ms/time)			Fast+: 0.56ms (＞5kHz), Fast: 3.3ms, Middle: 90ms, Slow: 220ms.
Basic Accuracy			0.001
Ciss, Coss, Crss			0.00001pF – 9.99999F
Rg			0.001mΩ – 99.9999MΩ
Δ%			±（0.000% – 999.9%）
Multi-Function Parameter List Scan	Spots		20 spots, the average number can be set for each spot, and each spot can be sorted separately
	Parameter		Test Frequency, Vg, Vd, Channel
	Trigger Mode		Sequence SEQ: After one trigger, measure at all sweep points, /EOM/INDEX output only once. Step: perform a sweep point measurement per trigger, each point outputs /EOM/INDEX, but the list scan comparator result is only output at the last /EOM
Graphic Scan	Scanning Spots		Any Spot is optional, up to 1001 Spots
	Result Display		Multiple curves with the same parameter and different Vg; multiple curves with the same Vg and different parameters.
	Display Range		Real-time automatic, locked
	Coordinate ruler		Logarithmic, linear
	Parameter		Vg, Vd
	Trigger Mode	Single	Manual trigger once, complete one scan from the start spot to the end spot, and start a new scan with the next trigger signal
		Continuous	Infinite loop scan from the start spot to the end spot
	Result Storage		Graphics, files
Comparators	Bin		10Bin, PASS, FAIL
	Bin Deviation Setting		Deviation, Percent Deviation, Off
	Bin Mode		Tolerance, continuous
	Bin Count		0-99999
	Bin Judgement		A maximum of four parameter limit ranges can be set for each bin. The corresponding bin number will be displayed within the setting range of the four test parameter results. If it exceeds the set maximum bin number range, FAIL will be displayed. Test parameters without upper and lower limits will be automatically ignored.
	PASS/FAIL indication		Satisfy Bin1-10, the PASS light on the front panel is on, otherwise the FAIL light is on.
Data Storage			201 measurement results can be read in batches
Storage File	Internal		About 100M non-volatile memory test setup file
	External USB		Test setup files, screenshots, log files
Keyboard Lock			Lockable front panel buttons, other functions to be expanded
Interface	USB HOST		2 USB HOST interfaces, which can be connected to the mouse and keyboard at the same time, and only one U disk can be used at the same time
	USB DEVICE		Universal Serial Bus socket, small type B (4 contact positions); compliant with USB TMC-USB488 and USB2.0, female connector for connecting external controllers.
	LAN		10/100M Ethernet, 8 pins, two speed options
	HANDLER		Used for Bin signal output
	RS232C		Standard 9-pin, crossed
	RS485		Can receive modification or external RS232 to RS485 module
Boot Warm-up Time			60 Minutes
Input voltage			100-120VAC/198-242VAC Option, 47-63Hz
Power consumption			More than 130VA
Dimensions (WHD) mm			430177405
Weight			12kg